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Showing results 1 to 4 of 4

Issue Date	Title Author(s) Journal	View
2016-07	Al(In)N/GaN Fin-Type HEMT With Very-Low Leakage Current and Enhanced I-V Characteristic for Switching Applications Seo, Jae Hwa ; Jo, Young-Woo ; Yoon, Young Jun ; Son, Dong-Hyeok ; Won, Chul-Ho ; Jang, Hwan Soo ; Kang, In Man ; Lee, Jung-Hee IEEE Electron Device Letters, v.37, no.7, pp.855 - 858, 2016-07	536
2010-04-14	Detection of mutant p53 using field-effect transistor biosensor Han, Sang Hee ; Kim, Sang Kyu ; Park, Kyoungsook ; Yi, So Yeon ; Park, Hye-Jung ; Lyu, Hong-Kun ; Kim, Moonil ; Chung, Bong Hyun Analytica Chimica Acta, v.665, no.1, pp.79 - 83, 2010-04-14	581
2010-04-14	Detection of mutant p53 using field-effect transistor biosensor Han, Sang Hee ; Kim, Sang Kyu ; Park, Kyoungsook ; Yi, So Yeon ; Park, Hye-Jung ; Lyu, Hong-Kun ; Kim, Moonil ; Chung, Bong Hyun Analytica Chimica Acta, v.665, no.1, pp.79 - 83, 2010-04-14	48
2015-09	Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode Kim, Joonwoo ; Myung, Sung ; Noh, Hee-Yeon ; Jeong, Soon Moon ; Jeong, Jaewook AIP Advances, v.5, no.9, 2015-09	656

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