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Issue Date	Title Author(s) Journal	View
2015-09	Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode Kim, Joonwoo ; Myung, Sung ; Noh, Hee-Yeon ; Jeong, Soon Moon ; Jeong, Jaewook AIP Advances, v.5, no.9, 2015-09	655

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