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Issue Date Title Author(s) Journal View
2017-12 596
2017-08

Impact of transient currents caused by alternating drain stress in oxide semiconductors

Lee, Hyeon-Jun Cho, Sung Haeng Abe, Katsumi Lee, Myoung-Jae Jung, Minkyung

Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08

644
2020-04

Lee, Gwang Jun Heo, Su Jin Lee, Seungchul Yang, Jae Hoon Jun, Byoung Ok Kim, Hyun Sik Jang, Jae Eun

ACS Applied Materials & Interfaces, v.12, no.16, pp.19226 - 19234, 2020-04

543
1

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