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dc.contributor.author Lee, Gwang Jun -
dc.contributor.author Kim, Joonwoo -
dc.contributor.author Kim, Jung-Hye -
dc.contributor.author Jeong, Soon Moon -
dc.contributor.author Jang, Jae Eun -
dc.contributor.author Jeong, Jaewook -
dc.date.available 2017-05-11T01:38:01Z -
dc.date.created 2017-04-10 -
dc.date.issued 2014-03 -
dc.identifier.issn 0268-1242 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/1589 -
dc.description.abstract We investigated electrical properties of transparent amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) with amorphous indium zinc oxide (a-IZO) transparent electrodes on a flexble thin glass substrate. The TFTs show a high field-effect mobility, a good subthreshold slope and a high on/off ratio owing to the high temperature thermal annealing process which cannot be applied to typical transparent polymer-based flexible substrates. Bias stress instability tests applying tensile stress concurrently with the bending radius of up to 40 mm indicated that mechanically and electrically stable a-IGZO TFTs can be fabricated on the transparent thin glass substrate. © 2014 IOP Publishing Ltd. -
dc.publisher Institute of Physics Publishing -
dc.title High performance, transparent a-IGZO TFTs on a flexible thin glass substrate -
dc.type Article -
dc.identifier.doi 10.1088/0268-1242/29/3/035003 -
dc.identifier.scopusid 2-s2.0-84894266417 -
dc.identifier.bibliographicCitation Semiconductor Science and Technology, v.29, no.3 -
dc.subject.keywordAuthor a-IGZO -
dc.subject.keywordAuthor a-InGaZnO -
dc.subject.keywordAuthor thin-film transistors -
dc.subject.keywordAuthor bending -
dc.subject.keywordAuthor thin glass substrate -
dc.subject.keywordAuthor bias stress -
dc.citation.number 3 -
dc.citation.title Semiconductor Science and Technology -
dc.citation.volume 29 -

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