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Effective control over near band-edge emission in ZnO/CuO multilayered films

Title
Effective control over near band-edge emission in ZnO/CuO multilayered films
Authors
Allabergenov, BunyodShaislamov, UlugbekShim, Hyun SeokLee, Myeong JaeMatnazarov, AnvarChoi, Byeong Dae
DGIST Authors
Lee, Myeong JaeChoi, Byeong Dae
Issue Date
2017
Citation
Optical Materials Express, 7(2), 494-502
Type
Article
Article Type
Article
Keywords
Amorphous FilmsCopperCopper OxidesCrystallographic DefectsEffective DopingEmission PropertiesHigh Resolution Transmission Electron MicroscopyLaser RadiationLaser TechniqueMicro-StructuralMulti-Layered FilmsNear Band Edge EmissionsOptical PropertiesPhoto-Luminescent PropertiesPhotoluminescence SpectroscopySemiconductor DopingThin-FilmsTransmission Electron MicroscopyZinc Oxide
ISSN
2159-3930
Abstract
We report on a study of the microstructural and photoluminescent properties of ZnO/CuO multilayered films. Multilayered ZnO/CuO thin films were deposited on amorphous SiO2/Si substrates by a pulsed laser technique and their microstructural and optical properties were characterized by transmission electron microscopy (TEM) and photoluminescence spectroscopy. TEM and XRD analyses of annealed ZnO/CuO films reveal the formation of multiple crystallographic defects and modification of the dominant growth plane, indicating effective doping of Cu atoms into the ZnO lattice. Consequently, near-band-edge emission in ZnO can be controlled through the number of CuO layers. Redshift of the near-band-edge emission peak from 385 nm up to 422 nm is achieved by increasing the number of CuO layers up to a certain number, above which a downward shift is observed. The results demonstrate that the emission properties of ZnO can be modified and precisely controlled by incorporation of CuO thin layers as a Cu-doping source. © 2017 Optical Society of America.
URI
http://hdl.handle.net/20.500.11750/5056
DOI
10.1364/OME.7.000494
Publisher
OSA - The Optical Society
Related Researcher
Files:
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Collection:
Intelligent Devices and Systems Research Group1. Journal Articles


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