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Issue Date Title Author(s) Journal View
2017-08

Impact of transient currents caused by alternating drain stress in oxide semiconductors

Lee, Hyeon-Jun Cho, Sung Haeng Abe, Katsumi Lee, Myoung-Jae Jung, Minkyung

Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08

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