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Showing results 5 to 9 of 9

Issue Date Title Author(s) Journal View
2020-11

Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes

Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes

Lee, Myoung-Jae ;  Seo, David H. ;  Kwon, Sung Min ;  Kim, Dohun ;  Kim, Youngwook ;  Yun, Won Seok ;  Cha, Jung-Hwa ;  Song, Hyeon-Kyo ;  Lee, Shinbuhm ;  Jung, Minkyung ;  et al

American Chemical Society, 2020-11

 630
2023-09
Multipurpose organic–inorganic hybrid dielectrics with photothermal crosslinking of zirconium-oxo clusters

Kim, Ga Hye ;  Park, Joohyung ;  Kim, Do Jeon ;  Jo, Jeong-Wan ;  Kim, Seonhyoung ;  Hong, Jongin ;  Park, Sung Kyu ;  Ahn, Kyunghan ;  Baeg, Kang-Jun ;  Kim, Myung-Gil

Journal of Alloys and Compounds, v.955, 2023-09

 10
2020-04

Prefrontal functional connectivity analysis of cognitive decline for early diagnosis of mild cognitive impairment: A functional near-infrared spectroscopy study

Prefrontal functional connectivity analysis of cognitive decline for early diagnosis of mild cognitive impairment: A functional near-infrared spectroscopy study

Yu, Jin-Woo ;  Lim, Sung-Ho ;  Kim, Bomin ;  Kim, Eunho ;  Kim, Kyungsoo ;  Park, Sung Kyu ;  Byun, Young Seok ;  Sakong, Joon ;  Choi, Ji-Woong

Optical Society of America, 2020-04

 549
2024
Recent Advances in Smart Tactile Sensory Systems with Brain-Inspired Neural Networks

Lee, Junho ;  Kwak, Jee Young ;  Keum, Kyobin ;  Kim, Kang Sik ;  Kim, Insoo ;  Lee, Myoung-Jae ;  Kim, Yong-Hoon ;  Park, Sung Kyu

Advanced Intelligent Systems, 2024

 61
2018-09
Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

Lee, Myoung-Jae ;  Park, Gyeong-Su ;  Seo, David Hyungseok ;  Kwon, Sung Min ;  Lee, Hyeon-Jun ;  Kim, June-Seo ;  Jung, Minkyung ;  You, Chun-Yeol ;  Lee, Hyangsook ;  Kim, Hee-Goo ;  et al

ACS Applied Materials & Interfaces, v.10, no.35, pp.29757 - 29765, 2018-09

 699
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