Repository Collection: null https://scholar.dgist.ac.kr/handle/20.500.11750/1139 2026-04-15T19:36:21Z 2026-04-15T19:36:21Z Identifying Structural Defects During Driving Electronic Devices https://scholar.dgist.ac.kr/handle/20.500.11750/6271 2025-07-24T07:28:56Z 2018-01-10T15:00:00Z Title: Identifying Structural Defects During Driving Electronic Devices Abstract: DGIST research team discovered the blocking phenomenon of electrons generated during high-speed driving of oxide semiconductors and proved its causes for the first time in the world 2018-01-10T15:00:00Z