Repository Collection: null https://scholar.dgist.ac.kr/handle/20.500.11750/1139 Wed, 15 Apr 2026 19:36:21 GMT 2026-04-15T19:36:21Z Identifying Structural Defects During Driving Electronic Devices https://scholar.dgist.ac.kr/handle/20.500.11750/6271 Title: Identifying Structural Defects During Driving Electronic Devices Abstract: DGIST research team discovered the blocking phenomenon of electrons generated during high-speed driving of oxide semiconductors and proved its causes for the first time in the world Wed, 10 Jan 2018 15:00:00 GMT https://scholar.dgist.ac.kr/handle/20.500.11750/6271 2018-01-10T15:00:00Z