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Issue Date	Title Author(s) Journal	View
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	402
2017-12	Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor Lee, Hyeon-Jun ; Abe, Katsumi ; Kim, June-Seo ; Lee, Myoung Jae Nature Publishing Group, 2017-12	597
2017-08	Impact of transient currents caused by alternating drain stress in oxide semiconductors Lee, Hyeon-Jun ; Cho, Sung Haeng ; Abe, Katsumi ; Lee, Myoung-Jae ; Jung, Minkyung Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08	646
2023-06	Wafer-scale transistor arrays fabricated using slot-die printing of molybdenum disulfide and sodium-embedded alumina Kwon, Yonghyun Albert ; Kim, Jihyun ; Jo, Sae Byeok ; Roe, Dong Gue ; Rhee, Dongjoon ; Song, Younguk ; Kang, Byoungwoo ; Kim, Dohun ; Kim, Jeongmin ; Kim, Dae Woo ; et al Nature Electronics, v.6, no.6, pp.443 - 450, 2023-06	96

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