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Issue Date	Title Author(s) Journal	View
2018-11	An Attack-Resilient CPS Architecture for Hierarchical Control: A Case Study on Train Control Systems Won, Yuchang ; Yu, Buyeon ; Park, Jaegeun ; Park, In Hee ; Jeong, Haegeon ; Balk, Jeanseong ; Kang, Kyungtae ; Lee, Insup ; Son, Sang Hyuk ; Park, Kyung-Joon ; Eun, Yongsoon Computer, v.51, no.11, pp.46 - 55, 2018-11	618
2019-08	Cyber-Physical Vulnerability Analysis of Communication-Based Train Control Kim, Sangjun ; Won, Yuchang ; Park, In-Hee ; Eun, Yongsoon ; Park, Kyung-Joon IEEE Internet of Things Journal, v.6, no.4, pp.6353 - 6362, 2019-08	528
2022-10	A Data-Driven Indirect Estimation of Machine Parameters for Smart Production Systems Kim, Seunghyeon ; Won, Yuchang ; Park, Kyung-Joon ; Eun, Yongsoon IEEE Transactions on Industrial Informatics, v.18, no.10, pp.6537 - 6546, 2022-10	246
2019-04	Resilient architecture for network and control co-design under wireless channel uncertainty in cyber-physical systems Kim, Dohwan ; Won, Yuchang ; Eun, Yongsoon ; Park, Kyung-Joon Wiley Blackwell, 2019-04	587
2021-11	Continuous productivity improvement using ioe data for fault monitoring: An automotive parts production line case study Won, Yuchang ; Kim, Seunghyeon ; Park, Kyung-Joon ; Eun, Yongsoon MDPI, 2021-11	387
2020-12-18	An Indirect Estimation of Machine Parameters for Serial Production Lines with Bernoulli Reliability Model Kim, Seunghyeon ; Won, Yuchang ; Park, Kyung-Joon ; Eun, Yongsoon 59th IEEE Conference on Decision and Control, CDC 2020, pp.5540 - 5545, 2020-12-18	7
2024-02	Deep Reinforcement Learning-Driven Scheduling in Multijob Serial Lines: A Case Study in Automotive Parts Assembly Lee, Sanghoon ; Kim, Jinyoung ; Wi, Gwangjin ; Won, Yuchang ; Eun, Yongsoon ; Park, Kyung-Joon IEEE Transactions on Industrial Informatics, v.20, no.2, pp.2932 - 2943, 2024-02	164
2024-03	Throughput Approximation by Neural Network for Serial Production Lines With High Up/Downtime Variability Kim, Seunghyeon ; Won, Yuchang ; Park, Kyung-Joon ; Eun, Yongsoon IEEE Transactions on Industrial Informatics, v.20, no.3, pp.4227 - 4235, 2024-03	241

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