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ICT Research Institute
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1. Journal Articles
3
2. Conference Papers
0
3. Patents
0
4. News
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ETC
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- Author
3
Koo, Gyogwon
2
Yun, Jong Pil
1
Choi, H.
1
Choi, Hyeyeon
1
Kim, B.J.
1
Kim, Min Su
1
Kim, S.W.
1
Kim, Sang Woo
1
Lee, Chungki
1
Lee, Sang Jun
.
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- Subject
2
Deep learning
2
Industrial application
2
Semantic segmentation
1
Billet identification
1
Billets (metal bars)
1
CLASSIFICATION
1
Computer vision
1
Conventional algorithms
1
Deep neural networks
1
Defect detection
.
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- Date issued
2
2021
1
2020
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Weakly supervised power line detection algorithm using a recursive noisy label update with refined broken line segments
Unified deep neural networks for end-to-end recognition of multi-oriented billet identification number
Automated defect inspection system for metal surfaces based on deep learning and data augmentation
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