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Issue Date Title Author(s) Journal View
2020-04
Automated defect inspection system for metal surfaces based on deep learning and data augmentation

Yun, Jong Pil ;  Shin, Woosang Crino ;  Koo, Gyogwon ;  Kim, Min Su ;  Lee, Chungki ;  Lee, Sang Jun

Elsevier BV, 2020-04

 843
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