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Issue Date	Title Author(s) Journal	View
2012-10	Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires Fukata, N[Fukata, Naoki] ; Mitome, M[Mitome, Masanori] ; Sekiguchi, T[Sekiguchi, Takashi] ; Bando, Y[Bando, Yoshio] ; Kirkham, M[Kirkham, Melanie] ; Hong, JI[Hong, Jung-Il] ; Wang, ZL[Wang, Zhong Lin] ; Snydert, RL[Snydert, Robert L.] American Chemical Society, 2012-10	572

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