Showing results 2 to 3 of 3
Na, Seok‐In ; Seo, You‐Hyun ; Nah, Yoon‐Chae ; Kim, Seok‐Soon ; Heo, Hyojung ; Kim, Jueng‐Eun ; Rolston, Nicholas ; Dauskardt, Reinhold H. ; Gao, Mei ; Lee, Youngu ; et al
John Wiley & Sons Ltd., 2019-02
Kim, Chul ; Jeon, Sung Woong ; Kim, Chung Hwan
Measurement Science and Technology, v.28, no.12, 2017-12