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Issue Date Title Author(s) Journal View
2019-02

Na, Seok‐In Seo, You‐Hyun Nah, Yoon‐Chae Kim, Seok‐Soon Heo, Hyojung Kim, Jueng‐Eun Rolston, Nicholas Dauskardt, Reinhold H. Gao, Mei Lee, Youngu et al

John Wiley & Sons Ltd., 2019-02

570
2017-12

Kim, Chul Jeon, Sung Woong Kim, Chung Hwan

Measurement Science and Technology, v.28, no.12, 2017-12

324
1

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