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Issue Date	Title Author(s) Journal	View
2011-01	MEIS and ToF-SIMS analyses of organic ultrathin films for absolute quantification of functional groups Min, Hyegeun ; Moon, Dae Won ; Lee, Tae Geol John Wiley & Sons Inc., 2011-01	394
2019-07	Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films Min, Won Ja ; Marmitt, Gabriel ; Grande, Pedro L. ; Moon, DaeWon John Wiley & Sons Inc., 2019-07	373

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