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DGIST Scholar

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Issue Date	Title Author(s) Journal	View
2018-09	Effect of Substrate Roughness on Adhesion and Structural Properties of Ti-Ni Shape Memory Alloy Thin Film Kim, Dong Hwan ; Lee, Hyunsuk ; Bae, Joohyeon ; Jeong, Hyomin ; Choi, Byeongkeun ; Nam, Taehyun ; Noh, Jungpil American Scientific Publishers, 2018-09	659
2018-12	Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Hoyoung Elsevier B.V., 2018-12	728
2018-10	Interfacial energy band and phonon scattering effect in Bi2Te3-polypyrrole hybrid thermoelectric material Kim, Cham ; Baek, Ju Young ; Lopez, David Humberto ; Kim, Dong Hwan ; Kim, Hoyoung American Institute of Physics, 2018-10	720

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