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Laser-induced digital oxidation for copper-based flexible photodetectors

Title
Laser-induced digital oxidation for copper-based flexible photodetectors
Author(s)
Kwon, HyeokjinKim, JunilKo, KyungminMatthews, Manyalibo J.Suh, JoonkiKwon, Hyuk-JunYoo, Jae-Hyuck
DGIST Authors
Kwon, Hyuk-Jun
Issued Date
2021-02
Type
Article
Article Type
Article
Author Keywords
LaserCopperOxidationFlexible electronicsPhotodetectors
Keywords
Metallic filmsOxide mineralsPhotocurrentsPhotodetectorsPhotoelectron spectroscopyPhotonsScanning electron microscopySemiconductor lasersSubstratesThermooxidationFlexible photodetectorsFlexible substrateLaser-induced oxidationMetal semiconductor metal photodetectorScanning photocurrent microscopiesSemiconducting materialsTransport behaviorX ray photoemission spectroscopyCopper oxides
ISSN
0169-4332
Abstract
Copper oxide compounds (CuxO) with bandgaps of 1.3–2.1 eV (CuO) and 2.1–2.6 eV (Cu2O) have been investigated as promising p-type semiconducting materials. CuxO is generally obtained by deposition or thermal oxidation, but those methods are not optimal for flexible substrates. Furthermore, additional patterning steps are required to fabricate devices. We present an easy, controllable method to fabricate a metal-semiconductor-metal (MSM) photodetector using laser-induced oxidation of a thin Cu film. After laser irradiation, the Cu film is heated under ambient conditions, and this leads to a thermal oxidation reaction, in which Cu oxide is monolithically formed in the Cu film and a Cu-CuxO-Cu MSM structure is produced. Since the laser offers localized heating, an arbitrary CuxO pattern can be written in the Cu film by spatially controlled heating. In addition, by optimizing the heating time, the laser-induced oxidation can be successfully performed even on a flexible substrate. To study the laser-induced oxidation, we examined the correlation between laser parameters and the oxidation pattern and analyzed the composition using scanning electron microscopy, Raman spectroscopy, and X-ray photoemission spectroscopy. Furthermore, we measured the transient photoresponse and employed scanning photocurrent microscopy to investigate the mechanism of carrier transport behavior. © 2020
URI
http://hdl.handle.net/20.500.11750/12554
DOI
10.1016/j.apsusc.2020.148333
Publisher
Elsevier B.V.
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Appears in Collections:
Department of Electrical Engineering and Computer Science Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab. 1. Journal Articles

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