Cited 19 time in webofscience Cited 23 time in scopus

Sensitivity map generation in electrical capacitance tomography using mixed normalization models

Title
Sensitivity map generation in electrical capacitance tomography using mixed normalization models
Authors
Kim, YS[Kim, Yong Song]Lee, SH[Lee, Seong Hun]Ijaz, UZ[Ijaz, Umer Zeeshan]Kim, KY[Kim, Kyung Youn]Choi, BY[Choi, Bong Yeol]
DGIST Authors
Lee, SH[Lee, Seong Hun]
Issue Date
2007-07
Citation
Measurement Science and Technology, 18(7), 2092-2102
Type
Article
Article Type
Article
Keywords
Adaptive ModelCapacitanceElectric Field EffectsElectrical Capacitance TomographyFunction EvaluationMathematical ModelsSensitivity MapThresholding ModelTomography
ISSN
0957-0233
Abstract
This work is concerned with the generation of sensitivity maps in electrical capacitance tomography based on the concepts of electrical field centre lines. Electrical capacitance tomography systems are normalized at the upper and lower permittivity values for image reconstruction. Conventional normalization assumes the distribution of materials in parallel and results in normalized capacitance as a linear function of measured capacitance. A recent approach is the usage of a series sensor model which results in normalized capacitance as a nonlinear function of measured capacitance. In this study different forms of normalizations are combined with sensitivity maps based on electrical field centre lines and it is shown that a mix of two normalization models improves the reconstruction performance. © 2007 IOP Publishing Ltd.
URI
http://hdl.handle.net/20.500.11750/1709
DOI
10.1088/0957-0233/18/7/040
Publisher
Institute of Physics Publishing
Related Researcher
Files:
There are no files associated with this item.
Collection:
ETCETC
Convergence Research Center for Future Automotive Technology1. Journal Articles


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