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dc.contributor.author Allabergenov, Bunyod -
dc.contributor.author Yun, Sanghun -
dc.contributor.author Choi, Byeongdae -
dc.date.accessioned 2023-01-06T19:40:12Z -
dc.date.available 2023-01-06T19:40:12Z -
dc.date.created 2022-11-05 -
dc.date.issued 2022-10 -
dc.identifier.issn 1944-8244 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/17328 -
dc.description.abstract Vanadium dioxide (VO2)-based thin films have received considerable attention in recent years due to their superior performance in creating next-generation color-rendering materials. The near-room-temperature metal-insulator transition of VO2 promises the advantage of active color tuning in the visible wavelength range. Although various results of dynamic color generation combined with plasmonic nanostructures are currently being investigated, so far, very few studies have addressed the visible-light optical performance of pure VO2 thin films prepared on conventional substrates. This article shows in detail the phase transition behavior of VO2 thin films in the visible wavelength range of 400-750 nm prepared on glass with subsequent annealing at temperatures of 350, 400, 450, and 500 degrees C. The results show an anomalous phase transition reducing the overall RGB reflectivity correlated with the crystallization behavior of the VO2 phase and scattering effect. The sample annealed at 350 degrees C shows the smallest phase transition at 47 degrees C, correlating with a crystallite size of 7 nm. The blue band reflectivity anomaly after annealing at 450 degrees C was considered an effect of the secondary reflection. The results of this research could play a huge role in the production of active switching photonic devices, color-managed reflectors, and temperature indicators. © 2022 American Chemical Society. All rights reserved. -
dc.language English -
dc.publisher American Chemical Society -
dc.title Metal-Insulator Transition Detection of Vanadium Dioxide Thin Films by Visible Light Reflection -
dc.type Article -
dc.identifier.doi 10.1021/acsami.2c11366 -
dc.identifier.wosid 000871018100001 -
dc.identifier.scopusid 2-s2.0-85139984388 -
dc.identifier.bibliographicCitation ACS Applied Materials & Interfaces, v.14, no.42, pp.47841 - 47852 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordAuthor direct current sputter -
dc.subject.keywordAuthor RGB reflection -
dc.subject.keywordAuthor thermochromic thin films -
dc.subject.keywordAuthor vanadium dioxide -
dc.subject.keywordAuthor phase transition -
dc.subject.keywordPlus PHASE-TRANSITION -
dc.subject.keywordPlus VO2 FILMS -
dc.subject.keywordPlus TEMPERATURE -
dc.subject.keywordPlus XPS -
dc.citation.endPage 47852 -
dc.citation.number 42 -
dc.citation.startPage 47841 -
dc.citation.title ACS Applied Materials & Interfaces -
dc.citation.volume 14 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.type.docType Article -
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