Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SH[Kim, Shin Hye] | ko |
dc.contributor.author | Kim, J[Kim, Jeongkwon] | ko |
dc.contributor.author | Moon, DW[Moon, Dae Won] | ko |
dc.contributor.author | Han, SY[Han, Sang Yun] | ko |
dc.date.available | 2017-07-11T06:38:52Z | - |
dc.date.created | 2017-04-10 | - |
dc.date.issued | 2013-01 | - |
dc.identifier.citation | Journal of the American Society for Mass Spectrometry, v.24, no.1, pp.167 - 170 | - |
dc.identifier.issn | 1044-0305 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/3279 | - |
dc.description.abstract | We report here that a commercial silicon-on-insulator (SOI) wafer offers an opportunity for laser desorption/ionization (LDI) of peptide molecules, which occurs directly from its flat surface without requiring special surface preparation. The LDI-on-SOI exhibits intact ionization of peptides with a good detection limit of lower than 20 fmol, of which the mass range is demonstrated up to insulin with citric acid additives. The LDI process most likely arises from laser-induced surface heating promoted by two-dimensional thermal confinement in the thin Si surface layer of the SOI wafer. As a consequence of the thermal process, the LDI-on-SOI method is also capable of creating post-source decay (PSD) of the resulting peptide LDI ions, which is suitable for peptide sequencing using conventional TOF/TOF mass spectrometry. © 2012 American Society for Mass Spectrometry. | - |
dc.publisher | Springer | - |
dc.subject | Acid Additives | - |
dc.subject | Citric Acid | - |
dc.subject | Desorption | - |
dc.subject | Detection Limits | - |
dc.subject | Electrical Equipment | - |
dc.subject | Flat Surfaces | - |
dc.subject | Heating | - |
dc.subject | Insulin | - |
dc.subject | Ions | - |
dc.subject | Laser | - |
dc.subject | Laser-Induced Surface Heating | - |
dc.subject | Laser Desorption/Ionization | - |
dc.subject | Laser Desorption/Ionization Mass Spectrometries | - |
dc.subject | Laser Desorption/Ionization Mass Spectrometry | - |
dc.subject | Laser Induced | - |
dc.subject | Lasers | - |
dc.subject | Limit of Detection | - |
dc.subject | Mass Spectrometry | - |
dc.subject | Models, Chemical | - |
dc.subject | Peptide Analysis | - |
dc.subject | Peptide Sequencing | - |
dc.subject | Peptides | - |
dc.subject | Postsource Decay | - |
dc.subject | Si Surfaces | - |
dc.subject | Silicon | - |
dc.subject | Silicon-on-Insulator (SOI) Wafer | - |
dc.subject | Silicon on Insulator Wafer | - |
dc.subject | Silicon on Insulator Wafers | - |
dc.subject | Silicon Wafers | - |
dc.subject | Soi Wafers | - |
dc.subject | Special Surfaces | - |
dc.subject | Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization | - |
dc.subject | Surface Heating | - |
dc.subject | Thermal Confinement | - |
dc.subject | Thermal Process | - |
dc.subject | Time of Flight Mass Spectrometry | - |
dc.subject | Two-Dimensional (2-D) | - |
dc.title | Commercial Silicon-on-Insulator (SOI) Wafers as a Versatile Substrate for Laser Desorption/Ionization Mass Spectrometry | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/s13361-012-0534-4 | - |
dc.identifier.wosid | 000314044300020 | - |
dc.identifier.scopusid | 2-s2.0-84873050151 | - |
dc.type.local | Article(Overseas) | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.contributor.nonIdAuthor | Kim, SH[Kim, Shin Hye] | - |
dc.contributor.nonIdAuthor | Kim, J[Kim, Jeongkwon] | - |
dc.contributor.nonIdAuthor | Han, SY[Han, Sang Yun] | - |
dc.identifier.citationVolume | 24 | - |
dc.identifier.citationNumber | 1 | - |
dc.identifier.citationStartPage | 167 | - |
dc.identifier.citationEndPage | 170 | - |
dc.identifier.citationTitle | Journal of the American Society for Mass Spectrometry | - |
dc.type.journalArticle | Article | - |
dc.contributor.affiliatedAuthor | Moon, DW[Moon, Dae Won] | - |
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