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Throughput Approximation by Neural Network for Serial Production Lines With High Up/Downtime Variability

Title
Throughput Approximation by Neural Network for Serial Production Lines With High Up/Downtime Variability
Author(s)
Kim, SeunghyeonWon, YuchangPark, Kyung-JoonEun, Yongsoon
Issued Date
2024-03
Citation
IEEE Transactions on Industrial Informatics, v.20, no.3, pp.4227 - 4235
Type
Article
Author Keywords
high variabilityIndustry 4.0throughput analysisWeibull distributionDeep learning
Keywords
MODELS
ISSN
1551-3203
Abstract
Most of the existing studies on analyzing the productivity of serial production lines focus on cases where the coefficient of variation () for both uptime and downtime is less than 1. Hardly any result is available when , i.e., uptime and downtime of machines exhibit high variability. The improvement of the production lines with high variable uptime and downtime depends on heuristic trial and error due to the lack of analysis method. This article suggests a neural network that approximates the throughput of serial production lines from machine and buffer parameters. Four neural network architectures (multilayer perceptron, recurrent neural network, long short-term memory (LSTM), and gated recurrent unit) are compared to determine the most effective architecture for the throughput approximation task. Training data are obtained from discrete-event simulations, encompassing a wide range of parameters. The results indicate that the LSTM model outperforms the other architecture considered. Furthermore, we present bottleneck identification and continuous improvement scenarios utilizing the model. © 2023 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See https://www.ieee.org/publications/rights/index.html for more information.
URI
http://hdl.handle.net/20.500.11750/46731
DOI
10.1109/TII.2023.3321026
Publisher
Institute of Electrical and Electronics Engineers
Related Researcher
  • 박경준 Park, Kyung-Joon
  • Research Interests Cyber-Physical Systems; Robot Operating System (ROS); Smart Manufacturing
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Appears in Collections:
Department of Electrical Engineering and Computer Science DSC Lab(Dynamic Systems and Control Laboratory) 1. Journal Articles
Department of Electrical Engineering and Computer Science CSI(Cyber-Physical Systems Integration) Lab 1. Journal Articles

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