Division of Electronics & Information System 2. Conference Papers
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Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry

Title
Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry
Author(s)
Yun, Jinhyo Joseph ; Avvari, Mohan V. ; Jung, Wooyoung ; Jeong, Eui Seob
Issued Date
2012-06-13
Citation
7th International Forum on Knowledge Asset Dynamics (IFKAD) / 5th Knowledge Cities World Summit (KCWS), pp.2087 - 2107
Type
Conference Paper
ISBN
9788896687086
URI
http://hdl.handle.net/20.500.11750/47415
Publisher
Institute of Knowledge Asset Management (IKAM)
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Appears in Collections:
Division of Automotive Technology 2. Conference Papers
Division of Electronics & Information System 2. Conference Papers

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