Cited time in webofscience Cited time in scopus

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dc.contributor.author Heo, Su Jin -
dc.contributor.author Shin, Jeong Hee -
dc.contributor.author Jun, Byoung Ok -
dc.contributor.author Jang, Jae Eun -
dc.date.accessioned 2024-01-30T01:40:14Z -
dc.date.available 2024-01-30T01:40:14Z -
dc.date.created 2023-11-10 -
dc.date.issued 2023-10 -
dc.identifier.issn 1936-0851 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/47698 -
dc.description.abstract A nano vacuum tube which consists of a vacuum transistor and a nano vacuum chamber was demonstrated. For the device, a vacuum region is an electron transport channel, and a vacuum is a tunneling barrier. Tilted angle evaporation was studied for the formation of the nano level vacuum chamber structure. This vacuum tube was ultraminiaturized with several tens of 10-18 L scale volume and 10-6 Torr of pressure. The device structure made it possible to achieve a high integration density and to sustain the vacuum state in various real operations. In particular, the vacuum transistor performed stably in extreme external environments because the tunneling mechanism showed a wide range of working stability. The vacuum was sustained well by the sealing layer and provided a defect-free tunneling junction. In tests, the high vacuum level was maintained for more than 15 months with high reliability. The Al sealing layer and tube structure can effectively block exposed light such as visible light and UV, enabling the stable operation of the tunneling transistor. In addition, it is estimated that the structure blocks approximately 5 keV of X-ray. The device showed stable operating characteristics in a wide temperature range of 100-390 K. Therefore, the vacuum tube can be used in a wide range of applications involving integrated circuits while resolving the disadvantages of a large volume in old vacuum tubes. Additionally, it can be an important solution for next-generation devices in various fields such as aerospace, artificial intelligence, and THz applications. © 2023 The Authors. Published by American Chemical Society. -
dc.language English -
dc.publisher American Chemical Society -
dc.title Vacuum Tunneling Transistor with Nano Vacuum Chamber for Harsh Environments -
dc.type Article -
dc.identifier.doi 10.1021/acsnano.3c02916 -
dc.identifier.wosid 001082586800001 -
dc.identifier.scopusid 2-s2.0-85175271115 -
dc.identifier.bibliographicCitation ACS Nano, v.17, no.20, pp.19696 - 19708 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor nano vacuum tube -
dc.subject.keywordAuthor vacuum tunneling -
dc.subject.keywordAuthor nano vacuumchamber -
dc.subject.keywordAuthor tilted angle deposition -
dc.subject.keywordAuthor extreme environmentstability -
dc.subject.keywordPlus FIELD-EMISSION TRIODE -
dc.subject.keywordPlus ARRAYS -
dc.subject.keywordPlus PERFORMANCE -
dc.subject.keywordPlus FABRICATION -
dc.subject.keywordPlus CATHODES -
dc.subject.keywordPlus GRAPHENE -
dc.subject.keywordPlus VOLTAGE -
dc.citation.endPage 19708 -
dc.citation.number 20 -
dc.citation.startPage 19696 -
dc.citation.title ACS Nano -
dc.citation.volume 17 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Chemistry; Science & Technology - Other Topics; Materials Science -
dc.relation.journalWebOfScienceCategory Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.type.docType Article -

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