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Issue Date	Title Author(s) Journal	View
2014-11	Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS Houssiau, L. ; Noel, C. ; Mine, N. ; Jung, K. W. ; Min, W. J. ; Moon, D. W. Wiley Blackwell, 2014-11	892
2011-01	MEIS and ToF-SIMS analyses of organic ultrathin films for absolute quantification of functional groups Min, Hyegeun ; Moon, Dae Won ; Lee, Tae Geol John Wiley & Sons Inc., 2011-01	394
2019-07	Round-robin test of medium-energy ion scattering for quantitative depth profiling of ultrathin HfO 2 /SiO 2 /Si films Min, Won Ja ; Marmitt, Gabriel ; Grande, Pedro L. ; Moon, DaeWon John Wiley & Sons Inc., 2019-07	373

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