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Showing results 1 to 5 of 5

Issue Date Title Author(s) Journal View
2022-08

Kim, Minsong Yang, Junmo Kim, Donghyun Yun, Dongwon

Measurement: Journal of the International Measurement Confederation, v.200, 2022-08

155
2023-07

Sim, Minkyung Jang, Jeonggyun Shin, Kwonsik Kim, Dongsu Kim, Joonghyun Kwon, Hyuk-Jun Kang, Hongki Jang, Jae Eun

IEEE Electron Device Letters, v.44, no.7, pp.1184 - 1187, 2023-07

217
2024

Jeonggyun Jang

DGIST, 2024

47
2018 807
2017 791
1

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