Lasing of scarred mode near above threshold in a semiconductor microcavity laser
- Title
- Lasing of scarred mode near above threshold in a semiconductor microcavity laser
- Author(s)
- Lee, In-Goo ; Yi, Chang-Hwan ; Lee, Ji-Won ; Ryu, Jinhyeok ; Gwak, Sunjae ; Oh, Kwang-Ryong ; Kim, Chil-Min
- DGIST Authors
- Kim, Chil-Min
- Issued Date
- 2020-07
- Type
- Article
- Article Type
- Article
- Keywords
- UNIDIRECTIONAL EMISSION ; DIRECTIONAL EMISSION ; WAVE CHAOS ; LABEL-FREE ; SENSITIVITY
- ISSN
- 0146-9592
- Abstract
- We study a lasing of mode groups in a fully chaotic rounded D-shape InGaAsP semiconductor microcavity laser when an electrode is smaller than a cavity (inward gap). Although there are numerous unstable periodic orbits supporting resonances, a mode group localized on period-5 unstable periodic orbit is more competitive than the others for our laser configuration of the inward gap. By means of theoretical and numerical analyses with ray and wave dynamics, we show that the analyses well agree with our experimental results. © 2020 Optical Society of America.
- Publisher
- Optical Society of America
- Related Researcher
-
-
Kim, Chil-Min
- Research Interests Laser; Nonlinear Dynamics; Quantum Chaos; Microcavity Laser
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- Appears in Collections:
- Department of Physics and Chemistry Micro Laser Laboratory 1. Journal Articles
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