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Issue Date	Title Author(s) Journal	View
2022-07-13	Improving compute in-memory ECC reliability with successive correction Crafton, Brian ; Wan, Zishen ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Wu, Wei ; Tokunaga,Carlos ; De, Vivek ; Raychowdhury, Arijit Design Automation Conference, pp.745 - 750, 2022-07-13	11
2022-05-30	Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory Crafton, Brian ; Talley, Connor ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Raychowdhury, Arijit IEEE International Symposium on Circuits and Systems (ISCAS 2022), pp.70 - 74, 2022-05-30	10
2022-05	BitS-Net: Bit-Sparse Deep Neural Network for Energy-Efficient RRAM-Based Compute-In-Memory Karimzadeh, Foroozan ; Yoon, Jong-Hyeok ; Raychowdhury, Arijit IEEE Transactions on Circuits and Systems I: Regular Papers, v.69, no.5, pp.1952 - 1961, 2022-05	201
2022-03	A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding Yoon, Jong-Hyeok ; Chang, Muya ; Khwa, Win-San ; Chih, Yu-Der ; Chang, Meng-Fan ; Raychowdhury, Arijit IEEE Journal of Solid-State Circuits, v.57, no.3, pp.845 - 857, 2022-03	168
2022-01	A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection Yoon, Jong-Hyeok ; Chang, Muya ; Khwa, Win-San ; Chih, Yu-Der ; Chang, Meng-Fan ; Raychowdhury, Arijit IEEE Journal of Solid-State Circuits, v.57, no.1, pp.68 - 79, 2022-01	358

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