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Issue Date Title Author(s) Journal View
2022-07-13
Improving compute in-memory ECC reliability with successive correction

Crafton, Brian ;  Wan, Zishen ;  Spetalnick, Samuel ;  Yoon, Jong-Hyeok ;  Wu, Wei ;  Tokunaga,Carlos ;  De, Vivek ;  Raychowdhury, Arijit

Design Automation Conference, pp.745 - 750, 2022-07-13

 11
2022-06-14
DualPIM: A Dual-Precision and Low-Power CNN Inference Engine Using SRAM- and eDRAM-based Processing-in-Memory Arrays

Jung, Sangwoo ;  Lee, Jaehyun ;  Noh, Huiseong ;  Yoon, Jong-Hyeok ;  Kung, Jaeha

4th IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2022, pp.70 - 73, 2022-06-14

 56
2022-05-30
Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory

Crafton, Brian ;  Talley, Connor ;  Spetalnick, Samuel ;  Yoon, Jong-Hyeok ;  Raychowdhury, Arijit

IEEE International Symposium on Circuits and Systems (ISCAS 2022), pp.70 - 74, 2022-05-30

 9
2022-05
BitS-Net: Bit-Sparse Deep Neural Network for Energy-Efficient RRAM-Based Compute-In-Memory

Karimzadeh, Foroozan ;  Yoon, Jong-Hyeok ;  Raychowdhury, Arijit

IEEE Transactions on Circuits and Systems I: Regular Papers, v.69, no.5, pp.1952 - 1961, 2022-05

 200
2022-03
A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, v.57, no.3, pp.845 - 857, 2022-03

 165
2022-01
A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, v.57, no.1, pp.68 - 79, 2022-01

 355
2022-10-20
A Neuromorphic SLAM Accelerator Supporting Multi-Agent Error Correction in Swarm Robotics

Lee, Jaehyun ;  Yoon, Jong-Hyeok

19th International SoC Design Conference (ISOCC) - SoC Technology Towards a New Era of Innovation, pp.241 - 242, 2022-10-20

 55
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