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Commercial Silicon-on-Insulator (SOI) Wafers as a Versatile Substrate for Laser Desorption/Ionization Mass Spectrometry
- Commercial Silicon-on-Insulator (SOI) Wafers as a Versatile Substrate for Laser Desorption/Ionization Mass Spectrometry
- Kim, SH[Kim, Shin Hye]; Kim, J[Kim, Jeongkwon]; Moon, DW[Moon, Dae Won]; Han, SY[Han, Sang Yun]
- DGIST Authors
- Moon, DW[Moon, Dae Won]
- Issue Date
- Journal of the American Society for Mass Spectrometry, 24(1), 167-170
- Article Type
- Acid Additives; Citric Acid; Desorption; Detection Limits; Electrical Equipment; Flat Surfaces; Heating; Insulin; Ions; Laser; Laser-Induced Surface Heating; Laser Desorption/Ionization; Laser Desorption/Ionization Mass Spectrometries; Laser Desorption/Ionization Mass Spectrometry; Laser Induced; Lasers; Limit of Detection; Mass Spectrometry; Models, Chemical; Peptide Analysis; Peptide Sequencing; Peptides; Postsource Decay; Si Surfaces; Silicon; Silicon-on-Insulator (SOI) Wafer; Silicon on Insulator Wafer; Silicon on Insulator Wafers; Silicon Wafers; Soi Wafers; Special Surfaces; Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization; Surface Heating; Thermal Confinement; Thermal Process; Time of Flight Mass Spectrometry; Two-Dimensional (2-D)
- We report here that a commercial silicon-on-insulator (SOI) wafer offers an opportunity for laser desorption/ionization (LDI) of peptide molecules, which occurs directly from its flat surface without requiring special surface preparation. The LDI-on-SOI exhibits intact ionization of peptides with a good detection limit of lower than 20 fmol, of which the mass range is demonstrated up to insulin with citric acid additives. The LDI process most likely arises from laser-induced surface heating promoted by two-dimensional thermal confinement in the thin Si surface layer of the SOI wafer. As a consequence of the thermal process, the LDI-on-SOI method is also capable of creating post-source decay (PSD) of the resulting peptide LDI ions, which is suitable for peptide sequencing using conventional TOF/TOF mass spectrometry. © 2012 American Society for Mass Spectrometry.
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