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Alam, M. D. Nur
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Ullah, Ihsan
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Al-Absi, Ahmed Abdulhakim
- 2020-07-08
- Alam, M. D. Nur. (2020-07-08). Deep Learning-Based Apple Defect Detection with Residual SqueezeNet. International Conference on Smart Computing and Cyber Security: Strategic Foresight, Security Challenges and Innovation, SMARTCYBER 2020, 127–134. doi: 10.1007/978-981-15-7990-5_12
- International Conference on Smart Computing and Cyber Security (SmartCyber)
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