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Issue Date	Title First-Author(s) Journal	Views
2020	Deep Learning-Based Apple Defect Detection with Residual SqueezeNet Alam, M. D. Nur; Ullah, Ihsan; Al-Absi, Ahmed Abdulhakim International Conference on Smart Computing and Cyber Security: Strategic Foresight, Security Challenges and Innovation, SMARTCYBER 2020, 127-134	426

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