Browsing by Titles

Showing results 1 to 5 of 5

  • Yoo, Woosuk
  • Choo, Seongmin
  • Lee, Kyujoon
  • Jo, Sinyong
  • You, Chun-Yeol
  • Hong, Jung-Il
  • Jung, Myung-Hwa
  • 2015-11
  • Yoo, Woosuk. (2015-11). Exchange Bias Effect Determined by Anisotropic Magnetoresistance in CoxNi1-xO/Ni0.8Fe0.2 Bilayer System. IEEE Transactions on Magnetics, 51(11). doi: 10.1109/TMAG.2015.2435738
  • Institute of Electrical and Electronics Engineers Inc.
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  • Han, Dong-Soo
  • Lee, Kyujoon
  • Hanke, Jan-Philipp
  • Mokrousov, Yuriy
  • Kim, Kyoung-Whan
  • Yoo, Woosuk
  • van Hees, Youri L. W.
  • Kim, Tae-Wan
  • Lavrijsen, Reinoud
  • You, Chun-Yeol
  • et al
  • 2019-07
  • Han, Dong-Soo. (2019-07). Long-range chiral exchange interaction in synthetic antiferromagnets. Nature Materials, 18(7), 703–708. doi: 10.1038/s41563-019-0370-z
  • Nature Publishing Group
  • View : 634
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  • Bang, Hyun-Woo
  • Yoo, Woosuk
  • Choi, Youngha
  • You, Chun-Yeol
  • Hong, Jung-Il
  • Dolinsek, Janez
  • Jung, Myung-Hwa
  • 2016-01
  • Bang, Hyun-Woo. (2016-01). Perpendicular magnetic anisotropy properties of tetragonal Mn3Ga films under various deposition conditions. Current Applied Physics, 16(1), 63–67. doi: 10.1016/j.cap.2015.10.012
  • Elsevier B.V.
  • View : 993
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Role of top and bottom interfaces of a Pt/Co/AlOx system in Dzyaloshinskii-Moriya interaction, interface perpendicular magnetic anisotropy, and magneto-optical Kerr effect

  • Kim, Nam-Hui
  • Cho, Jaehun
  • Jung, Jinyong
  • Han, Dong-Soo
  • Yin, Yuxiang
  • Kim, June-Seo
  • Swagten, Henk J. M.
  • Lee, Kyujoon
  • Jung, Myung-Hwa
  • You, Chun-Yeol
  • 2017-03
  • Kim, Nam-Hui. (2017-03). Role of top and bottom interfaces of a Pt/Co/AlOx system in Dzyaloshinskii-Moriya interaction, interface perpendicular magnetic anisotropy, and magneto-optical Kerr effect. AIP Advances, 7(3). doi: 10.1063/1.4978867
  • American Institute of Physics Inc.
  • View : 879
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  • 2021-02
  • Yoo, Woosuk. (2021-02). The Azimuthal Dependence of Exchange Bias Effect and Its Analysis by Spin Glass Model in Ni0.8Fe0.2/CoxNi1-xO Bilayers. IEEE Access, 9, 221315–21322. doi: 10.1109/ACCESS.2021.3055521
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 550
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