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Article
Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors
  • Choi, Yubin ; 
  • Yang, Hyojin ; 
  • Kim, Hwan Jin ; 
  • Park, Sejun ; 
  • Lee, Yoon Jung ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Kim, Dong Myong ; 
  • Kim, Haesung ; 
  • Bae, Jong-Ho
  • 2026-06
  • APPLIED PHYSICS LETTERS, v.128, no.24
  • AIP Publishing
  • View : 12
  • Download : 0
Article
Defect-mediated enhancement of memory window in IGZO-channel ferroelectric field effect transistors
  • Yang, Hyojin ; 
  • Kim, Haesung ; 
  • Kim, Hwan Jin ; 
  • Kim, Dong Myong ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Lee, Yoon Jung ; 
  • Bae, Jong-Ho
  • 2026-03
  • Materials Science in Semiconductor Processing, v.204
  • Elsevier
  • View : 93
  • Download : 0
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