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Article
Defect-mediated enhancement of memory window in IGZO-channel ferroelectric field effect transistors
  • Yang, Hyojin ; 
  • Kim, Haesung ; 
  • Kim, Hwan Jin ; 
  • Kim, Dong Myong ; 
  • Choi, Sung-Jin ; 
  • Kim, Dae Hwan ; 
  • Lee, Yoon Jung ; 
  • Bae, Jong-Ho
  • 2026-03
  • Materials Science in Semiconductor Processing, v.204
  • Elsevier
  • View : 21
  • Download : 0
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