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Article
Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition
  • Kim, Hansung ; 
  • Cha, Janghwan ; 
  • Seo, Jong Hyeok ; 
  • Cho, Beopgil ; 
  • Park, Jaemun ; 
  • Park, Keeseong ; 
  • Watanabe, Kenji ; 
  • Taniguchi, Takashi ; 
  • Ha, Dong Han ; 
  • Kwon, Jihwan ; 
    • et al
  • 2025-08
  • ACS Applied Materials & Interfaces, v.17, no.34, pp.48621 - 48630
  • American Chemical Society
  • View : 14
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Article
Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy
  • Min, Won Ja ; 
  • Park, Kyungsu ; 
  • Yu, Kyu-Sang ; 
  • Joo, Sungjung ; 
  • Kim, Yong-Sung ; 
  • Moon, Dae Won
  • 2015-10-07
  • Min, Won Ja. (2015-10-07). Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy. Journal of Applied Physics, 118(13). doi: 10.1063/1.4932149
  • American Institute of Physics Publishing
  • View : 963
  • Download : 0
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