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Automated defect inspection system for metal surfaces based on deep learning and data augmentation
  • Yun, Jong Pil ; 
  • Shin, Woosang Crino ; 
  • Koo, Gyogwon ; 
  • Kim, Min Su ; 
  • Lee, Chungki ; 
  • Lee, Sang Jun
  • 2020-04
  • Yun, Jong Pil. (2020-04). Automated defect inspection system for metal surfaces based on deep learning and data augmentation. doi: 10.1016/j.jmsy.2020.03.009
  • Elsevier BV
  • View : 1168
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