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  • Yun, Jong Pil
  • Shin, Woosang Crino
  • Koo, Gyogwon
  • Kim, Min Su
  • Lee, Chungki
  • Lee, Sang Jun
  • 2020-04
  • Yun, Jong Pil. (2020-04). Automated defect inspection system for metal surfaces based on deep learning and data augmentation. doi: 10.1016/j.jmsy.2020.03.009
  • Elsevier BV
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