Showing results 1 to 2 of 2
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Yun, Jong Pil
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Shin, Woosang Crino
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Koo, Gyogwon
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Kim, Min Su
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Lee, Chungki
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Lee, Sang Jun
- 2020-04
- Yun, Jong Pil. (2020-04). Automated defect inspection system for metal surfaces based on deep learning and data augmentation. doi: 10.1016/j.jmsy.2020.03.009
- Elsevier BV
- View : 1119
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Aziz, Jamal
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Kim, Honggyun
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Hussain, Tassawar
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Lee, Hojin
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Choi, Taekjib
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Rehman, Shania
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Khan, Muhammad Farooq
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Kadam, Kalyani D.
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Patil, Harshada
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Mehdi, Syed Muhammad Zain
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et al
- 2022-05
- Aziz, Jamal. (2022-05). Power efficient transistors with low subthreshold swing using abrupt switching devices. Nano Energy, 95. doi: 10.1016/j.nanoen.2022.107060
- Elsevier BV
- View : 288
- Download : 0
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