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  • Lee, Soohyun ; 
  • Lim, Younghwan ; 
  • Park, Sungmin ; 
  • Lee, Okkyun ; 
  • Cha, Bo Kyung ; 
  • Cho, Hyosung
  • 2026-05
  • IEEE Transactions on Nuclear Science, v.73, no.5, pp.1689 - 1697
  • Institute of Electrical and Electronics Engineers
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