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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article
Machine Learning Based on Digital Image Colorimetry Driven In Situ, Noncontact Plasma Etch Depth Prediction
  • Kang, Minji ; 
  • Kim, Seongho ; 
  • Go, Eunseo ; 
  • Paek, Donghyeon ; 
  • Lim, Geon ; 
  • Kim, Muyoung ; 
  • Kim, Changmin ; 
  • Kim, Soyeun ; 
  • Jang, Sung Kyu ; 
  • Bak, Moon Soo ; 
    • et al
  • ACCEPT
  • Advanced Intelligent Systems
  • Wiley
  • View : 33
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