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Showing results 1 to 2 of 2
Issue Date
Title
Author(s)
Article
Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features
An, Sion
;
Kim, Jaehong
;
Kim, Soopil
;
Chikontwe, Philip
;
Jung, Jiwook
;
Jeon, Hyejeong
;
Park, Sang Hyun
2024-12
An, Sion. (2024-12). Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features. Expert Systems with Applications, 256. doi: 10.1016/j.eswa.2024.124890
Elsevier
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Article
Privacy-Preserving Anomaly Detection with Homomorphic Encryption for Industrial Control Systems in Critical Infrastructure
Jeong, Dahoon
;
Kim, Yooshin
;
Shin, Donghoon
2025-08
IEEE Embedded Systems Letters, v.17, no.4, pp.276 - 279
Institute of Electrical and Electronics Engineers
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