Browsing by Titles

Showing results 1 to 3 of 3

  • Kim, Junghun ; 
  • Park, Ka Hyun ; 
  • Jang, Jun-Gi ; 
  • Kang, U.
  • 2026-04
  • IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, v.38, no.4, pp.2249 - 2261
  • IEEE COMPUTER SOC
  • View : 103
  • Download : 0
  • An, Sion ; 
  • Kim, Jaehong ; 
  • Kim, Soopil ; 
  • Chikontwe, Philip ; 
  • Jung, Jiwook ; 
  • Jeon, Hyejeong ; 
  • Park, Sang Hyun
  • 2024-12
  • An, Sion. (2024-12). Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features. Expert Systems with Applications, 256. doi: 10.1016/j.eswa.2024.124890
  • Elsevier
  • View : 507
  • Download : 0
  • 2025-08
  • IEEE Embedded Systems Letters, v.17, no.4, pp.276 - 279
  • Institute of Electrical and Electronics Engineers
  • View : 401
  • Download : 0
1