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  • Kim, Junghun
  • Park, Ka Hyun
  • Jang, Jun-Gi
  • Kang, U.
  • 2026-04
  • IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, v.38, no.4, pp.2249 - 2261
  • IEEE COMPUTER SOC
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  • 2024-12
  • An, Sion. (2024-12). Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features. Expert Systems with Applications, 256. doi: 10.1016/j.eswa.2024.124890
  • Elsevier
  • View : 420
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  • 2025-08
  • IEEE Embedded Systems Letters, v.17, no.4, pp.276 - 279
  • Institute of Electrical and Electronics Engineers
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