Showing results 1 to 3 of 3
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Park, Byung Nam
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Shon, Yeong Soo
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Choi, Sie Young
- 2008-02
- Park, Byung Nam. (2008-02). Effects of a magnetic field on the copper metallization using the electroplating process. Microelectronic Engineering, 85(2), 308–314. doi: 10.1016/j.mee.2007.06.018
- Elsevier BV
- View : 1045
- Download : 0
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Park, Byung Nam
;
-
Shon, Yeong Soo
;
-
Choi, Sie Young
- 2008-02
- Park, Byung Nam. (2008-02). Effects of a magnetic field on the copper metallization using the electroplating process. Microelectronic Engineering, 85(2), 308–314. doi: 10.1016/j.mee.2007.06.018
- Elsevier BV
- View : 1125
- Download : 0
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Mun, Ki-Yeung
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Hong, Tae Eun
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Cheon, Taehoon
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Jang, Yujin
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Lim, Byoung-Yong
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Kim, Sunjung
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Kim, Soo-Hyun
- 2014-07-01
- Mun, Ki-Yeung. (2014-07-01). The effects of nitrogen incorporation on the properties of atomic layer deposited Ru thin films as a direct-plateable diffusion barrier for Cu interconnect. Thin Solid Films, 562, 118–125. doi: 10.1016/j.tsf.2014.03.088
- Elsevier
- View : 711
- Download : 0
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