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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article
Automated defect inspection system for metal surfaces based on deep learning and data augmentation
  • Yun, Jong Pil ; 
  • Shin, Woosang Crino ; 
  • Koo, Gyogwon ; 
  • Kim, Min Su ; 
  • Lee, Chungki ; 
  • Lee, Sang Jun
  • 2020-04
  • Yun, Jong Pil. (2020-04). Automated defect inspection system for metal surfaces based on deep learning and data augmentation. doi: 10.1016/j.jmsy.2020.03.009
  • Elsevier BV
  • View : 1164
  • Download : 0
Article
Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features
  • 2024-12
  • An, Sion. (2024-12). Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence features. Expert Systems with Applications, 256. doi: 10.1016/j.eswa.2024.124890
  • Elsevier
  • View : 315
  • Download : 0
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