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Showing results 1 to 4 of 4

Article
Highly Reliable Magnetic-based Pressure Sensor utilizing Simple Microstructured PDMS: Mechanical and Design Analysis via Finite Element Analysis
  • Nora Asyikin Binti Zulkifli ; 
  • Jeong, Wooseong ; 
  • Kim, Mijin ; 
  • Kim, CheolGi ; 
  • Woo, Kyoohee ; 
  • Kwak, Bongseop ; 
  • Lee, Sungwon
  • 2021-08
  • Nora Asyikin Binti Zulkifli. (2021-08). Highly Reliable Magnetic-based Pressure Sensor utilizing Simple Microstructured PDMS: Mechanical and Design Analysis via Finite Element Analysis. IEEE Sensors Journal, 21(15), 16560–16567. doi: 10.1109/JSEN.2021.3077630
  • Institute of Electrical and Electronics Engineers
  • View : 931
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Article
Investigation of graphene dispersion on thermoelectric, magnetic, and mechanical properties of p-type Bi0.5Sb1.5Te3 alloys
  • Sharief, Pathan ; 
  • Madavali, Babu ; 
  • Song, Sung Ho ; 
  • Lee, Jin Kyu ; 
  • Kim, Ki Buem ; 
  • Kim, Jong Tae ; 
  • Kim, Dong Hwan ; 
  • Han, Jun-Hyun ; 
  • Hong, Soon-Jik
  • 2021-07
  • Sharief, Pathan. (2021-07). Investigation of graphene dispersion on thermoelectric, magnetic, and mechanical properties of p-type Bi0.5Sb1.5Te3 alloys. Materials Chemistry and Physics, 266. doi: 10.1016/j.matchemphys.2021.124512
  • Elsevier Ltd
  • View : 845
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Article
Perpendicular magnetic anisotropy properties of tetragonal Mn3Ga films under various deposition conditions
  • Bang, Hyun-Woo ; 
  • Yoo, Woosuk ; 
  • Choi, Youngha ; 
  • You, Chun-Yeol ; 
  • Hong, Jung-Il ; 
  • Dolinsek, Janez ; 
  • Jung, Myung-Hwa
  • 2016-01
  • Bang, Hyun-Woo. (2016-01). Perpendicular magnetic anisotropy properties of tetragonal Mn3Ga films under various deposition conditions. Current Applied Physics, 16(1), 63–67. doi: 10.1016/j.cap.2015.10.012
  • Elsevier B.V.
  • View : 1022
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Article
The Azimuthal Dependence of Exchange Bias Effect and Its Analysis by Spin Glass Model in Ni0.8Fe0.2/CoxNi1-xO Bilayers
  • 2021-02
  • Yoo, Woosuk. (2021-02). The Azimuthal Dependence of Exchange Bias Effect and Its Analysis by Spin Glass Model in Ni0.8Fe0.2/CoxNi1-xO Bilayers. IEEE Access, 9, 221315–21322. doi: 10.1109/ACCESS.2021.3055521
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 573
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