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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article
Storage-period dependent bias-stress instability of solution-processed amorphous indium-zinc-oxide thin-film transistors
  • 2015-09
  • Kim, Jung-Hye. (2015-09). Storage-period dependent bias-stress instability of solution-processed amorphous indium-zinc-oxide thin-film transistors. Current Applied Physics, 15(S2), S64–S68. doi: 10.1016/j.cap.2015.04.019
  • Elsevier
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