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- Jeong, Soon Moon
- 2014-11
- Jeong, Jaewook. (2014-11). Novel Gated-Multiprobe Method for Measuring a Back Electrode Effect in Amorphous Oxide-Based Thin-Film Transistors. IEEE Transactions on Electron Devices, 61(11), 3757–3761. doi: 10.1109/TED.2014.2359964
- Institute of Electrical and Electronics Engineers Inc.
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