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  • Woo, Jiheon ; 
  • Yoo, Chanhee ; 
  • Kim, Young-Sik ; 
  • Cassuto, Yuval ; 
  • Kim, Yongjune
  • 2023-05
  • IEEE Transactions on Information Forensics and Security, v.18, pp.3305 - 3317
  • Institute of Electrical and Electronics Engineers Inc.
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