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Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors

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Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors
  • Jeon, Changyeop ; 
  • Kim, Mijin ; 
  • Kim, Jinwoo ; 
  • Yang, Sunghee ; 
  • Choi, Eunseo ; 
  • Lim, Byeonghwa
  • 2025-02
  • Jeon, Changyeop. (2025-02). Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. Sensors, 25(4). doi: 10.3390/s25041235
  • MDPI
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