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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chung, U-In | - |
| dc.contributor.author | Kim, Young-Bae | - |
| dc.contributor.author | Lee, Seung Ryul | - |
| dc.contributor.author | Lee, Dongsoo | - |
| dc.contributor.author | Lee, Chang Bum | - |
| dc.contributor.author | Chang, Man | - |
| dc.contributor.author | Kim, Kyung min | - |
| dc.contributor.author | Hur, Ji Hyun | - |
| dc.contributor.author | Lee, Myoung-Jae | - |
| dc.contributor.author | Kim, Chang Jung | - |
| dc.date.accessioned | 2021-04-26T07:01:29Z | - |
| dc.date.available | 2021-04-26T07:01:29Z | - |
| dc.date.created | 2019-03-20 | - |
| dc.date.issued | 2012-06 | - |
| dc.identifier.citation | Frontiers in Electronic Materials, pp.53 - 54 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/13397 | - |
| dc.language | English | - |
| dc.publisher | Wiley-VCH Verlag GmbH & Co. KGaA | - |
| dc.title | Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1002/9783527667703.ch19 | - |
| dc.type.local | Article(Overseas) | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | Chung, U-In. (2012-06). Bi-Layered Reram: Multi-Level Switching, Reliability and its Mechanism for Storage Class Memory and Reconfiguration Logic. doi: 10.1002/9783527667703.ch19 | - |
| dc.description.journalClass | 1 | - |
| dc.citation.publicationname | Frontiers in Electronic Materials | - |
| dc.contributor.nonIdAuthor | Chung, U-In | - |
| dc.contributor.nonIdAuthor | Kim, Young-Bae | - |
| dc.contributor.nonIdAuthor | Lee, Seung Ryul | - |
| dc.contributor.nonIdAuthor | Lee, Dongsoo | - |
| dc.contributor.nonIdAuthor | Lee, Chang Bum | - |
| dc.contributor.nonIdAuthor | Chang, Man | - |
| dc.contributor.nonIdAuthor | Kim, Kyung min | - |
| dc.contributor.nonIdAuthor | Hur, Ji Hyun | - |
| dc.contributor.nonIdAuthor | Kim, Chang Jung | - |
| dc.identifier.citationStartPage | 53 | - |
| dc.identifier.citationEndPage | 54 | - |
| dc.identifier.citationTitle | Frontiers in Electronic Materials | - |
| dc.description.isOpenAccess | N | - |
| dc.contributor.affiliatedAuthor | Chung, U-In | - |
| dc.contributor.affiliatedAuthor | Kim, Young-Bae | - |
| dc.contributor.affiliatedAuthor | Lee, Seung Ryul | - |
| dc.contributor.affiliatedAuthor | Lee, Dongsoo | - |
| dc.contributor.affiliatedAuthor | Lee, Chang Bum | - |
| dc.contributor.affiliatedAuthor | Chang, Man | - |
| dc.contributor.affiliatedAuthor | Kim, Kyung min | - |
| dc.contributor.affiliatedAuthor | Hur, Ji Hyun | - |
| dc.contributor.affiliatedAuthor | Lee, Myoung-Jae | - |
| dc.contributor.affiliatedAuthor | Kim, Chang Jung | - |
