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Department of Physics and Chemistry
Lab for NanoBio-Materials & SpinTronics
1. Journal Articles
Bridge resistance compensation for noise reduction in a self-balanced phmr sensor
Lee, Jaehoon
;
Jeon, Changyeop
;
Jeon, Taehyeong
;
Das, Proloy Taran
;
Lee, Yongho
;
Lim, Byeonghwa
;
Kim, CheolGi
Department of Physics and Chemistry
Lab for NanoBio-Materials & SpinTronics
1. Journal Articles
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Title
Bridge resistance compensation for noise reduction in a self-balanced phmr sensor
Issued Date
2021-06
Citation
Lee, Jaehoon. (2021-06). Bridge resistance compensation for noise reduction in a self-balanced phmr sensor. Sensors, 21(11), 3585. doi: 10.3390/s21113585
Type
Article
Author Keywords
Magnetoresistive sensors
;
Offset compensation
;
Planar Hall magnetoresistance
;
Self-balanced bridge
Keywords
Magnetic sensors
;
Manganese alloys
;
MEMS
;
Spectral density
;
Thermal noise
;
Device architectures
;
Noise abatement
;
Hall magnetoresistance
;
Low magnetic fields
;
Low-Frequency Noise
;
Magnetic field sensors
;
Micro electromechanical system (MEMS)
;
Sensor architectures
;
Sensor noise level
;
Binary alloys
;
Electromechanical devices
;
Iridium alloys
;
Iron alloys
;
Magnetic fields
ISSN
1424-8220
Abstract
Advanced microelectromechanical system (MEMS) magnetic field sensor applications de-mand ultra-high detectivity down to the low magnetic fields. To enhance the detection limit of the magnetic sensor, a resistance compensator integrated self-balanced bridge type sensor was devised for low-frequency noise reduction in the frequency range of 0.5 Hz to 200 Hz. The self-balanced bridge sensor was a NiFe (10 nm)/IrMn (10 nm) bilayer structure in the framework of planar Hall magnetoresistance (PHMR) technology. The proposed resistance compensator integrated with a self-bridge sensor architecture presented a compact and cheaper alternative to marketable MEMS MR sensors, adjusting the offset voltage compensation at the wafer level, and led to substantial improvement in the sensor noise level. Moreover, the sensor noise components of electronic and magnetic origin were identified by measuring the sensor noise spectral density as a function of temperature and operating power. The lowest achievable noise in this device architecture was estimated at ~3.34 nV/√Hz at 100 Hz. © 2021 by the authors. Licensee MDPI, Basel, Switzerland.
URI
http://hdl.handle.net/20.500.11750/15417
DOI
10.3390/s21113585
Publisher
Multidisciplinary Digital Publishing Institute (MDPI)
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Kim, CheolGi
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Department of Physics and Chemistry
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