Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, M.S. | - |
dc.contributor.author | Park, S.H. | - |
dc.contributor.author | Choi, Songhee | - |
dc.contributor.author | Kim, J. | - |
dc.contributor.author | Lee, K.H. | - |
dc.contributor.author | Noh, S.Y. | - |
dc.contributor.author | Chae, B.N. | - |
dc.contributor.author | Lee, Shinbuhm | - |
dc.contributor.author | Kim, B.J. | - |
dc.contributor.author | Lee, J.S. | - |
dc.date.accessioned | 2023-01-10T14:10:10Z | - |
dc.date.available | 2023-01-10T14:10:10Z | - |
dc.date.created | 2023-01-05 | - |
dc.date.issued | 2023-02 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/17368 | - |
dc.description.abstract | We investigated structural and electronic inhomogeneities in a VO2 thin film grown on a (001)-oriented TiO2 substrate by exploiting nano-scale and macroscopic probing techniques. A compressive strain along the out-of-plane direction becomes additionally relaxed via microcracks which form a micron-sized rectangular pattern. A large inhomogeneity in the dielectric response is observed near the crack, and this signifies a strong coupling between electronic and lattice degrees of freedom. Interestingly, the strong inhomogeneity is observed also inside of the rectangular pattern, and it shows a gradient along one crystalline axis. We attribute such peculiar inhomogeneity observed in a relatively large length scale possibly to a combined effect of the strain relaxation and an oxygen vacancy distribution. As the nano-scale inhomogeneities in structural and electronic properties will eventually determine macroscopic responsivities, this work can be a good guide in designing VO2 thin films with appropriate controls of the strain and the chemical composition to realize better functionalities. © 2022 | - |
dc.language | English | - |
dc.publisher | Elsevier | - |
dc.title | Roles of a strain relaxation and an oxygen vacancy on nanoscale inhomogeneities in VO2 thin film | - |
dc.title.alternative | Roles of a strain relaxation and an oxygen vacancy on nanoscale inhomogeneities in VO2 thin film | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.cap.2022.11.012 | - |
dc.identifier.wosid | 000903952700007 | - |
dc.identifier.scopusid | 2-s2.0-85144611882 | - |
dc.identifier.bibliographicCitation | Current Applied Physics, v.46, pp.40 - 45 | - |
dc.identifier.kciid | ART002933056 | - |
dc.description.isOpenAccess | FALSE | - |
dc.subject.keywordAuthor | VO2 | - |
dc.subject.keywordAuthor | Insulator-metal transition | - |
dc.subject.keywordAuthor | Nano infrared imaging | - |
dc.subject.keywordAuthor | Strain | - |
dc.subject.keywordAuthor | Oxygen vacancy | - |
dc.subject.keywordPlus | TRANSITION | - |
dc.citation.endPage | 45 | - |
dc.citation.startPage | 40 | - |
dc.citation.title | Current Applied Physics | - |
dc.citation.volume | 46 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science; Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary; Physics, Applied | - |
dc.type.docType | Article | - |
There are no files associated with this item.