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Correlation Between the Field-Driven Microscopic Magnetization Reversal and the Disorders in Ferromagnetic Systems
Ryu, Kwang-Su
;
Shin, Sung-Chul
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Title
Correlation Between the Field-Driven Microscopic Magnetization Reversal and the Disorders in Ferromagnetic Systems
DGIST Authors
Ryu, Kwang-Su
;
Shin, Sung-Chul
Issued Date
2016-07
Citation
Ryu, Kwang-Su. (2016-07). Correlation Between the Field-Driven Microscopic Magnetization Reversal and the Disorders in Ferromagnetic Systems. doi: 10.1109/TMAG.2016.2523684
Type
Article
Article Type
Article; Proceedings Paper
Author Keywords
Domain wall motion
;
magnetic disorders
;
magnetization reversal
Keywords
BEHAVIOR
;
Correlation Coefficient
;
Domain Wall Motion
;
Domain Walls
;
Ferromagnetic Materials
;
Ferromagnetic Systems
;
Ferromagnetism
;
Field Dependence
;
Film
;
Local Coercivity
;
Magnetic Disorder
;
Magnetic Disorders
;
Magnetic Disorders
;
Magnetic Storage
;
Magnetization
;
Magnetization Reversal
;
Magnetization Reversal
;
Magnetization Reversal Mechanisms
;
Nucleation
;
Thermal Activation
ISSN
0018-9464
Abstract
Understanding the field-driven microscopic magnetization reversal in a disordered ferromagnetic (FM) film is a fundamentally intriguing issue for the application of a disorder-induced magnetic memory. We present the field dependence of the correlation between local coercivity and switching time in the FM films showing two typical reversal processes: wall-motion and nucleation dominant ones. As the applied field strength increases, the correlation coefficient in the wall-motion sample decreases, whereas the one in the nucleation sample holds nearly zero value. The change in the wall-motion sample is well explained by the transition of the magnetization reversal mechanism from a thermal activation reversal to a viscous motion. This paper shows that the magnetization reversal mechanism depending on the time scale as well as the materials has a strong influence on the correlation. © 2016 IEEE.
URI
http://hdl.handle.net/20.500.11750/2248
DOI
10.1109/TMAG.2016.2523684
Publisher
Institute of Electrical and Electronics Engineers Inc.
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